X-ray Diffraction & Fluorescence:

Our advanced X-ray laboratory is equipped with cutting-edge instrumentation for comprehensive materials characterization, including X-ray fluorescence (XRF), powder X-ray diffraction (XRD), and single crystal X-ray diffraction (SCXRD). Together, these instruments enable detailed phase identification, elemental analysis, and structural determination, supporting scientific research in materials science, chemistry, geology, and beyond.

X-ray Fluorescence (XRF)

XRF an analytical technique that uses the interaction of X-rays with a material to determine its elemental composition. 

PANalytical Axios Max XRF Spectrometer: 

This versatile system analyzes a wide range of materials, including solids, liquids, and loose powders, with minimal sample preparation. It detects elements from sodium (Na) to uranium (U) and features a high-power Rh anode X-ray tube (up to 2.4 kW) for enhanced sensitivity.

Powder X-ray diffraction (PXRD) 

PXRD is a rapid analytical technique primarily used for phase identification of a crystalline material and can provide information on unit cell dimensions. The analyzed material is finely ground, homogenized, and average bulk composition is determined.

Rigaku SmartLab PXRD:

Powered by a 2.2 kW Cu anode source, this diffractometer operates in multiple modes, including Bragg-Brentano (focusing method) and GI-XRD (parallel beam). Its intuitive SmartLab Guidance package ensures precise alignment and data collection, and an extensive diffraction data library supports it.

Single-crystal X-ray diffraction (SCXRD) 

SCXRD is a non-destructive analytical technique which provides detailed information about the internal lattice of crystalline substances, including unit cell dimensions, bond-lengths, bond-angles, and details of site-ordering. Directly related is single-crystal refinement, where the data generated from the X-ray analysis is interpreted and refined to obtain the crystal structure.

Bruker D8 QUEST SCXRD: 

This system delivers exceptional structural determination capabilities with a Micro-Focus Mo Kⲁ radiation source (IμS 3.0) and a high-resolution PHOTON III detector. The APEX4 software package streamlines data collection and analysis, while the precision goniometer (< 7 μm sphere of confusion) and low-temperature device ensure high-quality results, even for challenging samples.

Sample preparation instruments: 

Retsch Ball Mill MM400 is used for fine grinding and homogenization of a wide range of materials.

Retsch CryoMill is used for cryogenic grinding of temperature-sensitive or elastic samples.

Retsch Automated Pellet Press PP35 is used for the preparation of uniform pellets for XRF and XRD analysis.

XRFuse 6 Electric Fusion Machine is used for the preparation of high-quality fused beads for XRF analysis.