Transmission Electron Microscopy:

Transmission Electron Microscopy (TEM) is a technique that uses a beam of high-energy electrons to create ultra-high-resolution images of the internal structure of ultrathin samples. Electrons are transmitted through the specimen, and their interaction with the sample's thickness, density, and composition is detected to form a magnified image on a screen or detector. TEM is used to visualize and analyze materials at the nanometer and atomic scales, revealing details like atomic arrangements, crystal structures, and internal features of cells and tissues, which are inaccessible to optical microscopes or Scanning Electron Microscopes (SEM). 

• High Resolution:

TEM offers exceptionally high magnification and resolution, allowing for the visualization of details at the atomic level. 

• Internal Structure Imaging:

Unlike other microscopy techniques that image surfaces, TEM provides detailed views of a sample's interior. 

• Thin Samples:

The samples must be extremely thin (often under 100 nm) for electrons to pass through and form an image. 

• Nanoscale Visualization:

TEM is crucial for studying materials and biological samples at the nanoscale, making it a vital tool in materials science and cell biology. 

JEOL JEM-1400PLUS:

The JEM-1400Plus is a classical  transmission electron microscope (TEM) developed for application in a wide range of disciplines, from biology to materials researches, such as biological sections, polymers, nanomaterials etc.

• 80-120 kV

• x1.5M magnification

• 4k high contrast camera OneView by Gatan